Detects defects not visible in visible light. High-speed SWIR line scan camera with 12.5μm pixels.
The "WAL-1001-GE" is an industrial SWIR line scan camera equipped with an InGaAs sensor. By capturing images in the SWIR wavelength range of 900 to 1700 nm, it visualizes the composition, moisture content, subsurface defects, and black plastics of materials that are difficult to identify under visible light, with high contrast. With large pixels of 12.5 μm and a high sensitivity design featuring a peak quantum efficiency of 83%, it captures clear images even in low light environments and during high-speed shutter operation. It can output up to 14 bits (16,384 levels), allowing for precise identification of subtle brightness differences.
【Features】
■ InGaAs line scan camera (1K) compatible with SWIR range (900-1700 nm)
■ Achieves high image quality with excellent S/N ratio and low light sensitivity due to large 12.5 μm pixels
■ Maintains image quality in high-speed shutter and low light environments with a peak quantum efficiency of up to 83%
■ High-speed scanning with a maximum line rate of 29 kHz (GigE Vision)
■ Outputs 8 to 14 bits (up to 16,384 levels) for high-definition representation of fine differences
* For detailed spectral sensitivity characteristics and dimensional drawings, please refer to the PDF materials.